Welcome Dr. Bin Xue ​from National University of Defense Technology to be Committee Member!

日期:2020-02-21 点击量:  609次


Dr. Bin Xue, National University of Defense Technology, China

Research Area: 
Artificial Intelligence, Machine Learning, Deep Learning, Signal Batch Processing, Intelligent Data Processing

Research Experience:
Bin Xue He received the B.S. degree in computer science and technology from the Zhongnan University of Economics and Law, in 2013, and the M.S. degree and Ph.D. degree from Airforce Engineering University, Xi’an, China, in 2015 and 2019, respectively. Currently, he is working in National University of Defense Technology. His major research interests are artificial intelligence, machine learning, deep Learning, signal batch processing, intelligent data processing, object detection and recognition, time series prediction and modern statistical analysis. He has been selected as ACM member, IEEE member, IEICE member, and AAAI member. He participated in numbers of NSFC and 863 projects. And He has published many articles in IEEE Transactions on Cybernetics (SCI Area I, impact factor 10.387) and other top international journals. He are the reviewers of IEEE Transactions on Cybernetics, IEEE Transactions on Industrial Electronics, IEEE Transactions on Aerospace and Electronic Systems, IEEE Transactions on Image Processing, IEEE Transactions on Antennas and Propagation, IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, Pattern Recognition, Mechanical Systems and Signal Processing, International Journal of Computer Vision, IEEE Access, Image and Vision Computing, IEEE Transactions on Geoscience and Remote Sensing, IEEE Transactions on Intelligent Transportation Systems, IEEE Sensors Journal, Computer Vision and Image Understanding, IEEE Geoscience and Remote Sensing Letters, IET Image Processing, Pattern Recognition and Artificial Intelligence, IET Computer Vision、Machine Vision and Applications, IEEE Antennas and Propagation Magazine, Wireless Personal Communications.